Defect Here

Carafe -- An Inductive Fault Analysis Tool for CMOS VLSI Circuits

Carafe is the second generation Inductive Fault Analysis (IFA) program designed to extract realistic faults from circuit layouts, originally written by Alvin Jee. Carafe has been developed in conjunction with the SCTest group under the direction of Joel Ferguson. The current version of Carafe is capable of extracting bridges, breaks, gate oxide shorts (GOS), and transistor gate bridge/break faults from rectilinear circuit layouts.


Get an encrypted copy of the current Carafe release. Send mail to Joel Ferguson for information on obtaining a key.


Read the Carafe Alpha.5 User's Manual on line.

Get a postscript copy of the manual.

Documentation for development features

Changes to .fab & .pro file format.
A little Partition Mode documentation.

Other Related Documents

Carafe Developers

CE/CIS Boards / University of California, Santa Cruz
Last modified by etphone Thu Sep 11 08:41:08 PDT 1997