Carafe -- An Inductive Fault Analysis Tool for CMOS VLSI Circuits
Carafe is the second generation Inductive Fault Analysis (IFA) program
designed to extract realistic faults from circuit layouts, originally
written by Alvin Jee.
Carafe has been developed in conjunction with the
SCTest group under the
The current version of Carafe is capable of extracting bridges,
breaks, gate oxide shorts (GOS), and transistor gate bridge/break faults
from rectilinear circuit layouts.
copy of the current Carafe release. Send mail to Joel Ferguson
for information on obtaining a key.
Carafe Alpha.5 User's Manual
copy of the manual.
Documentation for development features
Changes to .fab & .pro file format.
A little Partition Mode documentation.
Other Related Documents
- Extraction of Breaks in Rectilinear Layouts by Plane Sweeps,
by Jeffrey S. Rogenski. UCSC-CRL-94-21