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F. Joel Ferguson. Inductive Fault Analysis of VLSI Circuits. PhD thesis, Carnegie Mellon University, Department of Electrical and Computer Engineering, October 1987.

Tracy Larrabee. Efficient Generation of Test Patterns Using Boolean Satisfiability. PhD thesis, Stanford University, Department of Computer Science, STAN-CS-90-1302, February 1990.

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Jeffrey Rogenski and F. Joel Ferguson. Characterization of Opens in Logic Circuits. In Proceedings of IEEE ASIC Conference, 1994

David Dahle Wed Jan 24 11:51:06 PST 1996