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Major Changes from the Previous Version

Compound Faults
Carafe can now extract compound bridge and break faults that are capable of simultaneously bridging or breaking an arbitrarily large number of circuit elements, depending on the defect size.

New Fault Types
Carafe can now extract transistor gate bridge/break faults from circuit layouts.

Fault Visualization
Carafe now displays faults using the critical area of the fault instead of the more abstract length-widths. These critical areas can be viewed by defect size and layer.

David Dahle Wed Jan 24 11:51:06 PST 1996