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- Compound Faults
Carafe can now extract compound bridge and break faults that are
capable of simultaneously bridging or breaking an arbitrarily large
number of circuit elements, depending on the defect size.
- New Fault Types
Carafe can now extract transistor gate bridge/break faults from
- Fault Visualization
Carafe now displays faults using the critical area of the fault
instead of the more abstract length-widths. These critical areas
can be viewed by defect size and layer.
Wed Jan 24 11:51:06 PST 1996