Selected SCTest publications on ATPG.

Publications sorted in reverse chronological order:

H. Konuk Testing for Opens in Digital CMOS Circuits , Doctoral Thesis, University of California at Santa Cruz , Department of Computer Engineering , December 1996.

H. Konuk F. J. Ferguson, and T. Larrabee, Charge-based fault simulation for CMOS network breaks. IEEE Transactions on Computer-Aided Design, 1555-1567, December 1996.

H. Konuk, F.J. Ferguson, and T. Larrabee. Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks. In Proceedings of the Design Automation Conference, pages 345-351, 1995.

B. Chess, A Freitas, F.J. Ferguson, and T. Larrabee. Testing CMOS Logic Gates for Realistic Shorts. In Proceedings of the International Test Conference, pages 395-401, 1994.

C. Roth, Simulation and Test Pattern Generation for Bridge Faults in CMOS ICs, Masters Thesis, University of California at Santa Cruz , Department of Computer Engineering , June 1994.

B. Chess and T. Larrabee. Generating test patterns for bridge faults in CMOS ICs. In Proceedings of the European Test Conference , pages 165-170, 1994.

B. Chess and T. Larrabee. Bridge Fault Simulation Strategies for CMOS Integrated Circuits. In Proceedings of the Design Automation Conference, pages 458-462, 1993.

H. Konuk, and T. Larrabee. Explorations of Sequential ATPG Using Boolean Satisfiability. In Proceedings of the 11th VLSI Test Symposium, pages 85-90, 1993.

T. Larrabee and Y. Tsuji. Evidence for a Satisfiability Threshold for Random 3CNF Formulas. In Proceedings of the AAAI Symposium on AI and NP-Hard Problems, 1992.

T. Larrabee. Test Pattern Generation Using Boolean Satisfiability. In 1992. IEEE Transactions on Computer-Aided Design, pages 4-15, Jan, 1992.

F.J. Ferguson, and T. Larrabee. Test Pattern Generation for Realistic Bridge Faults in CMOS ICs, . In Proceedings of the International Test Conference, pages 492-499, 1991.

F.J. Ferguson, M. Taylor, and T. Larrabee. Testing for Parametric Faults in Static CMOS Circuits. In Proceedings of the International Test Conference, pages 436-443, 1990.


SCTEST Group / CE/CIS Boards / UC Santa Cruz