Selected SCTest publications on IFA and publications that were "Enabled" by IFA (sorted in reverse chronological order):

R. McGowen and F. J. Ferguson, Incorporating Physical Design-For-Test into Routing. In Proceedings of the International Test Conference, 685-693, November 1997.

A. Jee and F. J. Ferguson. A Methodology for Characterizing Cell Testability. In Proceedings of the 15th VLSI Test Symposium, 384-390, 1997.

H. Konuk, F. J. Ferguson, and T. Larrabee, Charge-based fault simulation for CMOS network breaks. IEEE Transactions on Computer-Aided Design, 1555-1567, December 1996.

F. J. Ferguson, and J. Yu, Maximum Likelihood Estimation for Yield Analysis . IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems , pages 149-157, November 1996.

H. Konuk and F. J. Ferguson. An Unexpected Factor in Testing for CMOS Opens: The Die Surface. In Proceedings of the 14th VLSI Test Symposium, 422-429, May 1996.

H. Konuk, F. J. Ferguson, and T. Larrabee. Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks. In Proceedings of the Design Automation Conference, pages 345-351, May 1995.

A. Jee and F. J. Ferguson. An Analysis of Shorts in CMOS Standard Cell Circuits. In Proceedings of the Seventh Annual IEEE International ASIC Conference and Exhibit, pages 362-365, 1994.

C. F. Hawkins, J. M. Soden, A. W. Righter, and F. J. Ferguson. Defect classes-an overdue paradigm for CMOS IC testing. In Proceedings of the International Test Conference, pages 413-425 1994.

J. Rogenski, Extraction of Breaks in Rectilinear Layouts by Plane Sweeps, Masters Thesis, University of California at Santa Cruz , Department of Computer Engineering , June 1994.

R. McGowen and F. J. Ferguson. Eliminating undetectable shorts between horizontal wires during channel routing. In Proceedings of the 12th VLSI Test Symposium, pages 402-407, 1994.

D. Y. Lepejian, J. M. Caywood, A. Kablanian, F. J. Ferguson, et al. An automated failure analysis (AFA) methodology for repeated structures.. In Proceedings of the 12th VLSI Test Symposium, pages 319-324, 1994.

J. Rogenski and F. J. Ferguson. Characterization of opens in logic circuits. In Proceedings of the Seventh Annual IEEE International ASIC Conference and Exhibit, pages 358-361, 1994.

A. Jee, and F.J. Ferguson. Carafe: An Inductive Fault Analysis Tool for CMOS VLSI Circuits. In Proceedings of the 11th VLSI Test Symposium, pages 92-98, 1993.


SCTEST Group / CE/CIS Boards / UC Santa Cruz